Progress in photonic integrated circuit (PIC) technology and applications is accelerating with the onset of an industrial ecosystem comprised of InP and SiP foundries, commercial modeling tools, and photonic test capability. Bringing optical test deeper from package level into the semiconductor process is an important step to assure performance and yield. A key aspect of testing at the wafer, bar and chip stage is fast reproducible optical coupling, including probe-position optimization and polarization alignment. Advanced methods and instruments developed for the fiberoptic communications industry are now being adapted for this new environment.

Join FormFactor and Keysight Technologies for a complimentary, on-demand webinar, where we will give an introduction to PICs and the silicon photonic industry as well as current challenges which must address a mixture of DC, RD and photonics testing. Leading the webinar will be Doug Baney, Department Manager for Keysight Laboratories, and Joe Frankel, Systems Engineer at FormFactor.

Doug is currently a department manager at Keysight Labs responsible for research in microwave test, nonlinear microwave modeling, nanomeasurement, measurement automation, photonics measurement, and integrated photonics applications. Joe is a systems engineer at FormFactor with a focus on probe station automaton. Moderating the webinar will be Stephen Hardy, Editorial Director and Associate Publisher of Lightwave.

Register for the webinar here. You can download the webinar and watch on any mobile device or even listen while in your car.

Enjoy!