As RF, microwave, and quantum technologies continue advancing, engineers are facing new challenges in wafer-level characterization at higher frequencies and more demanding operating conditions.

At the same time, teams are being asked to simplify test setups, improve throughput, and move products to market faster.

That’s why FormFactor is looking forward to participating in IMS 2026, the industry’s premier event for RF and microwave innovation being held in Boston, June 7-12. Throughout the conference, FormFactor experts will share insights on advanced on-wafer measurement techniques, 250 GHz wafer probing, and cryogenic RF testing strategies that help engineers overcome today’s most demanding test challenges.

IMS 2026 brings together leaders from across the RF ecosystem, including the IEEE MTT-S Radio Frequency Integrated Circuits Symposium (RFIC) and the Automatic Radio Frequency Techniques Group (ARFTG). This year’s event will spotlight innovations in:

  • 6G and next-generation RF connectivity
  • Satellite communications
  • Quantum computing technologies
  • Sub-THz and THz device characterization
  • AI/ML-driven RF design
  • Advanced semiconductor packaging and heterogeneous integration

These industry trends are increasing demand for accurate, high-frequency wafer test methods that can support next-generation semiconductor devices.

Enabling Broadband Thermal S-Parameter Measurements to 250 GHz

One challenge RF engineers continue to face is collecting accurate broadband S-parameter measurements across wide temperature ranges without slowing down testing or introducing uncertainty from band switching.

At IMS 2026, Gavin Fisher, Sr. Staff Applications Specialist at FormFactor, will present at the MicroApps seminar focused on addressing these challenges with advanced single-ended and differential measurement approaches.

Full Thermal Single Sweep Broadband S-Parameter Measurements to 250 GHz with Single Ended and Differential Approaches
Tuesday, June 8  |  16:16 MicroApps Theater

The session will showcase FormFactor’s latest measurement approach using:

  • Keysight NA5307A frequency extenders
  • InfinityXF probes
  • Thermal test capabilities from -60°C to 175°C
  • EMI and light-tight TopHat configurations
  • Open-access IceShield thermal environments

Attendees will also see measurement data from both passive and active devices, along with practical approaches for thermal module control during high-frequency testing.

As devices move toward sub-THz frequencies, maintaining stable and accurate measurements across temperature ranges becomes much harder. Engineers often face tradeoffs between bandwidth, stability, and setup complexity. FormFactor’s approach helps engineers simplify these workflows while maintaining the accuracy needed for next-generation RF development.

Tackling the Challenges of Cryogenic RF and mm-Wave Testing

The growth of quantum computing is creating a new set of challenges for RF and microwave measurement environments. While many engineers are familiar with thermal testing between -60°C and 125°C, cryogenic probing introduces a completely different set of challenges.

At temperatures approaching absolute zero, even seemingly minor effects, such as probe thermal loading or residual gas inside coaxial cables, can compromise measurement integrity.

FormFactor will address these critical considerations during the IMS 2026 workshop focused on microwave measurements supporting quantum technologies. Gavin Fisher will hold this industry workshop and talk about:

How to Succeed in RF and mm-Wave On-Wafer Testing at Cryogenic Temperatures?
Thursday, June 11  |  13:00 (estimated) Room 252AB

The workshop will explore:

  • Common pitfalls in cryogenic RF/mm-wave probing
  • Thermal loading effects during cryogenic measurements
  • Measurement stability challenges in vacuum environments
  • Cable and interconnect considerations often overlooked in cryogenic systems
  • Strategies for improving measurement accuracy and repeatability

As quantum technologies move closer to real-world deployment, reliable cryogenic wafer-level characterization is becoming critical for both research and production. Accurate RF and mm-wave measurements at cryogenic temperatures will be essential for scaling future quantum systems.

Supporting the Next Generation of RF Innovation

The rapid evolution of RF, mm-wave, and quantum technologies is reshaping the semiconductor industry. Whether engineers are developing advanced communication systems, AI infrastructure, aerospace electronics, or quantum processors, the need for accurate wafer-level characterization continues to grow.

At IMS 2026, FormFactor will share how its advanced probing technologies, thermal solutions, and RF measurement expertise are helping customers tackle some of the industry’s toughest test challenges.

If you’re attending IMS 2026, stop by to learn more about the latest advances in RF and microwave wafer test and see how FormFactor solutions are supporting next-generation semiconductor innovation.

Hope to see you in Boston!