November 6, 2026
High-voltage probes focus on providing the necessary isolation and safely delivering voltage to the DUT. Dedicated, replaceable probe tips provide contact with the device pad.
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August 27, 2025
Developed in partnership with Keysight Technologies, the probe works seamlessly with the PNA-X system and new 250 GHz coaxial frequency extension modules, using ruggedized 0.5 mm coaxial connectors.
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July 18, 2025
In this blog, we’ll explore the key electrical and mechanical factors that affect RF and microwave probe selection, helping you get the precision and consistency your application demands.
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May 23, 2024
There’s a new paper from FormFactor that presents a novel coaxial guarded, true-Kelvin MEMS analytical DC probe with replaceable tips, which is introduced to achieve precise and consistent device modelling wafer measurements.
Read MoreAugust 17, 2023
Deep Experience in DC Parametric Measurements Overcomes Challenges | READ MORE
September 24, 2021
The Impact of NRZ versus PAM4 on Wafer Test | READ MORE
October 25, 2018
Exploring The T-Wave Probe for THz Probing | READ MORE
September 6, 2018
Selecting the Right Engineering Probe for your Application Need | READ MORE
August 16, 2018
The Importance of Contact Performance for Accurate RF Measurement Results | READ MORE
April 19, 2018
Case Study: Challenges when Probing High Pad Count ICs and How FormFactor Overcomes These Challenges | READ MORE