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Broadband over Temperature Measurement Optimization for on Wafer Test

We will highlight the best methods for setting up, calibrating, and evaluating measurement performance in coaxial and waveguide bands spanning WR15 (75 GHz) to WR1 (1100 GHz) over a broad (-40 to 125c) temperature range
A novel out single sweep measurement from 900 Hz to 220 GHz will be shown along with detailed complete automation of these measurements. Many programming examples using WinCalXE software will be demonstrated automating data measurement and analysis for on wafer measurements. We also evaluate system stability and performance. A very convenient approach is discussed to allow safe and convenience band swaps and probe installation.

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