As RF, mmWave, sub-THz, and silicon photonics technologies advance, engineers are being asked to make accurate measurements at frequencies and levels of complexity that were difficult to imagine just a few years ago. Higher frequencies, wider bandwidths, increasingly complex devices, and tighter performance margins are putting more pressure on every part of the wafer test environment.

FormFactor will be at European Microwave Week (EuMW) 2026, October 4–9 at ExCeL London, Booth D10, showcasing technologies for broadband on-wafer measurements to 250 GHz, automated RF characterization, and integrated electrical and optical testing for silicon photonics.


How Can Engineers Make Accurate On-Wafer Measurements to 250 GHz?

As measurement frequencies extend into the sub-THz range, maintaining accuracy and repeatability becomes increasingly difficult. Signal loss, probe placement, crosstalk, calibration, temperature stability, and the measurement environment can all affect results.

Getting reliable results at 250 GHz takes more than a high-performance probe. The probe, calibration, instrumentation, thermal environment, and wafer positioning all have to work together.

At EuMW, we’ll highlight capabilities including:

  • InfinityXF© 250 GHz probes engineered for high-performance broadband on-wafer measurements with industry-leading insertion loss and return loss for GSG configurations.
  • Multi-port GSGSG and GSSG configurations, designed to deliver high-frequency performance with reduced crosstalk for more complex device characterization.
  • TopHat solutions, providing a fully shielded and temperature-stable environment that thermally monitors and protects Keysight 250 GHz frequency extender heads.
  • Automated RF measurement capabilities, helping engineers reduce manual intervention, improve repeatability, and make more efficient use of valuable lab time.

The result is measurement data engineers can trust, without having to wonder how much the test setup itself is influencing the result.


Moving Beyond Manual RF Measurement Workflows

Accurate measurements are essential, but engineers also need to collect them efficiently. As test plans become longer and more complex, manually managing every step can quickly consume valuable lab time.

Automation takes many of those repetitive steps out of the engineer’s hands while helping maintain consistency from one test run to the next. FormFactor’s autonomous measurement solutions are designed to increase test efficiency and reduce the cost and complexity associated with advanced characterization workflows.

This becomes especially valuable when engineers need to characterize large numbers of devices, make measurements across temperature, or run extended test sequences. When a test can run reliably without constant supervision, engineers can spend less time watching the probe station and more time working with the data.


Bringing RF and Silicon Photonics Test Together

Higher-frequency electrical test is only part of the story at EuMW. The rapid growth of AI infrastructure and high-speed communications is also increasing demand for silicon photonics and photonic integrated circuits (PICs).

PIC testing can be especially challenging because engineers may need to make electrical and optical measurements on the same device, often as part of the same test sequence.

FormFactor provides systems designed to support silicon photonics from development through production, bringing together precision wafer positioning, optical alignment, electrical probing, automation, and measurement integration. That makes it easier to use the same underlying test approach as devices move from early characterization toward more repeatable, higher-volume testing.

The same principle applies across our RF and silicon photonics portfolio: make the measurement process easier without sacrificing the accuracy and repeatability engineers need.


See FormFactor’s RF and Silicon Photonics Solutions at EuMW

Visitors to Booth D10 will have an opportunity to see FormFactor systems built for a range of high-frequency test requirements.

EVOLVITY™ 300 with 250 GHz GSGSG

At EuMW, EVOLVITY 300 will demonstrate broadband on-wafer probing with a 250 GHz GSGSG solution, giving attendees a closer look at how high-frequency measurements can be made simpler and more repeatable. The system is designed to make advanced on-wafer probing accessible while supporting demanding RF and mmWave applications.

SUMMIT200 for RF and Silicon Photonics

SUMMIT200 brings automation to both RF and silicon photonics applications. At EuMW, we’ll show how the platform can handle sophisticated measurement sequences where precise positioning, repeatability, and automation are critical. The system’s combination of fully automatic RF and silicon photonics capabilities is also highlighted in our EuMW event preview.

EPS200 for mmWave and THz Applications

For applications where engineers want the flexibility and hands-on control of a manual probe station, EPS200 supports demanding mmWave, THz, and load-pull measurements.

Together, these platforms show the range of approaches available for today’s high-frequency test challenges, from flexible manual probing to highly automated electrical and optical measurement.


Creating a More Seamless Measurement Environment

No single piece of equipment solves every high-frequency measurement challenge. Probe technology, probe stations, calibration, instrumentation, thermal management, software, and automation all need to work together.

At these frequencies, engineers shouldn’t have to spend their time figuring out how to make every piece of the test setup work together. FormFactor works closely with leading test and measurement partners so probes, stations, instrumentation, calibration, and software can operate as a more seamless measurement environment.

That collaboration becomes even more important as frequencies climb and measurement setups become more complex. The objective is to simplify the path from probe tip to instrument while giving engineers the accurate, repeatable results they need.


Visit FormFactor at European Microwave Week 2026

If you’re working on next-generation RF, mmWave, sub-THz, or silicon photonics devices, we’d welcome the opportunity to talk about your measurement challenges.

Visit FormFactor at Booth D10 during European Microwave Week 2026, October 4–9 at ExCeL London to see our latest 250 GHz wafer probing, automated RF, and silicon photonics test capabilities in action. The event newsletter also highlights InfinityXF broadband measurements up to 250 GHz and the RF and silicon photonics solutions planned for the booth.

Bring us your toughest measurement challenges. Whether you’re working at 250 GHz, looking to automate RF characterization, or trying to combine electrical and optical measurements for silicon photonics, our team will be ready to talk through the application.

We look forward to seeing you in London.