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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
150 mm Systems
Easy – flexible – future proof: Customize your 150 mm manual probe station with application-specific starter kits.
200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, 200 mm manual and automated wafer probe stations have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
300 mm Systems
Cascade 300 mm probe stations set the standard for manual and automated on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
Custom Probe Systems
Customized solutions for a variety of challenging applications
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