Join us at the Semiconductor Wafer Test Workshop (SWTW) for Three Great Presentations
May 31, 2018
Join us, June 3rd in San Diego, at the Semiconductor Wafer Test Workshop (SWTW). We have three presentations: 5G: The Next Disruptive Technology in Production Test, Enabling High Parallelism in Production RF Test, and Break the Myth of Wafer Probing on Cu for Fan-out Wafer Level Packaging.
May 24, 2018
Wafer-Level Electromigration – Lowering Operating Costs and Better Data Integrity
Wafer-level electromigration offers three key advantages to a reliability test program compared to PLR: faster time to test results, reduced operating...
May 17, 2018
Wafer-Level Electromigration – Reducing Cycle Time for Faster Feedback
Compressed timelines impels the industry to pursue methods of accelerating design and qualification cycles; utilizing EM WLR to complement EM PLR tang...
May 11, 2018
Production Test RF Calibration for Multi-DUT Probe Cards: How to Get the Most Accurate Measurements
To improve Cost of Ownership, many companies are moving to multi-DUT test to increase number of wafers tested per probe card and to increase speed of...