CM300xi – Enabling Automation While Compressing Cycle Times
July 26, 2018
We’ve integrated a number of our proprietary technologies to produce Contact Intelligence, which enable automation and compress cycle times to an absolute minimum, and the CM300xi probe system was the first to deliver this technology.
July 19, 2018
Wafer Prober: Characterization of MEMS Devices at Wafer-Level
For standard IC testing, we typically need only electrical input and output. Optionally, the measurements are done at different temperatures as well....
July 12, 2018
Five Benefits of the New TESLA200 High-Power Semiconductor Probing System
The TESLA200 allows engineers to collect data on individual or volume wafers, providing faster characterization and shorter time to market. Here are s...
July 9, 2018
Contact Intelligence for RF Probe Systems Raises the Bar
With Contact Intelligence, our advanced probe systems now automatically and autonomously adapt in real time to changes in the testing environment, ena...