Three Benefits of the Estrada WLR Test System
October 4, 2018
Everything for intrinsic reliability testing of TDDB, SILC, HCI, and BTI on the wafer is provided by the Estrada high-performance integrated measurement solution. Estrada systems marry the industry’s gold standard for engineering probe stations with a proven fast parallel reliability test system.
The Estrada turnkey wafer-level reliability (WLR) test system provides a smooth pathway toward accelerated reliability assessments and process qualifications on 300 mm wafer processes. This comprehensive WLR test cell is optimized for high-volume intrinsic reliability testing and is ready-to-use right out of the box. With several pre-validated configurations available, specifying and deploying a highly-capable test system has never been easier or quicker – no time is wasted searching for various equipment pieces and myriad options from multiple vendors, evaluating their suitability and compatibility, writing software, setting up the system, or worrying about support.
Everything needed for intrinsic reliability testing of TDDB, SILC, HCI, and BTI on the wafer is provided by the Estrada high-performance integrated measurement solution. Estrada systems marry the industry’s gold standard for engineering probe stations with a proven fast parallel reliability test system and high-performance probe cards.
Estrada is available as a multi-site configuration (FEL) as well as a single-site configuration (FES):
Both configurations deliver features and benefits that set them apart:
- User confidence. Delivers a fast path to first data with comprehensive, pre-validated solutions while coming with a single source for specification, ordering, installation, and support. There’s also a worldwide support network with local teams throughout Asia, the U.S., and Europe.
- Better throughput. High parallel DUT capacity for faster reliability study completion and better statistics. There are also parallel characterization measurements for faster experiment completion and stepping capability for automatic, unattended test at multiple touchdowns.
- A best-of-breed solution. Our CM300-S shielded, low-noise, semiautomatic probe station together with our Symphony™ parallel, high-accuracy WLR instrumentation is combined with Celadon Systems’ VersaTile high-performance probe cards. All this with our Conductor WLR test executive software and the Estrada is delivers best-of-breed technology.
Visit the Estrada integrated wafer-level reliability test system page on our site for details and downloads.