Delivering Zero-Defect IC Wafer Test for the Today’s Automotive Market Needs
November 26, 2019
Validated by key automotive manufacturers and deployed to various tester platforms (T2000, V93K DD, J750), the TrueScale Matrix 300mm wafer probe card is meeting the zero-defect challenge.
November 22, 2019
New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications
A new technical paper is now available that presents a novel method of probe-tip power calibration for S-parameters calibration which is shown to grea...
November 5, 2019
Customize a 150 mm Modular Probe Station Starting at $13,880
You can now customize your FormFactor 150 mm probe station with flexible modules at an incredibly low price! This makes it even easier to configure yo...
November 1, 2019
Experience the All New Velox 3 Probe Station Control Software
Windows 10 compatible – User-centered design – Efficient and robust. The all new Velox™ 3 is the first successfully completed step of our missio...