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Cascade Probe Systems

Probe systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

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          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Probe card manufacturing company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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                Asset 4
                  Company Blog July 11, 2019

                  Blog

                  Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures

                  July 11, 2019

                  The Autonomous RF Measurement Assistant enables fully autonomous, hands-free RF calibrations & measurements over multiple temperatures. Featuring the unique Contact Intelligence™ Technology, it reduces cost of test and accelerates time to market with increased accuracy and reduced design cycles.

                  It’s a challenge testing RF devices over multiple temperatures. You need to consider calibration drift, expansion or contraction of the test setup, and shrinking device pads to save real-estate space and minimize pad parasitics. Testing over multiple temperatures requires a continuous monitoring and readjustment of the calibration – a time-consuming and highly-demanding task. What’s more, new RF devices for applications such as 5G, autonomous driving and next generation Wi-Fi, need to have the most accurate device models for their IC designs.

                  To overcome these challenges, we have introduced the Autonomous RF Measurement Assistant to enable higher accuracy and more productivity, while minimizing training needs and accelerating time to market. Some of the industry firsts that this represents include:

                  • True automatic, hands-free calibration
                  • Monitoring of calibration drift and automatic re-calibration
                  • Full management of system expansion
                  • Accurate and repeatable probe positioning at all temperatures

                  As part of our Contact Intelligence™ Technology, the Autonomous RF Measurement Assistant is designed specifically to automate the whole calibration, measuring and monitoring tasks that are normally performed manually by experienced engineers. It delivers a number of benefits, including:

                  • Ease of use. An inexperienced operator can perform an RF calibration by simply pushing a button, reducing the need for experienced (and costly) full-time users on each system.
                  • Calibration monitor and re-calibration. The system will continuously monitor calibration drift, and automatically re-calibrate should the drift exceed a pre-defined limit.
                  • Data volume. Unattended test allows more tool utilization without additional time and money.
                  • Unattended use. Measurements can be left running overnight, testing all devices on the wafer, and at different temperatures without the need of the operator.
                  • Reduced soak time. The system will re-align the probes to the pads if they drift away from alignment, reducing the time of test while increasing throughput.

                  Only the Autonomous RF Measurement Assistant, and its combination of FormFactor’s advanced programmable positioners, the unique eVue microscope, Velox Probe Station Control Software and WinCal XE high-performance RF calibration software enables fully autonomous, hands-free calibrations and measurements of RF devices over multiple temperatures. It leverages the CM300xi, SUMMIT200, Summit 12000, or Elite 300 probe stations, reduces cost of test and accelerates time to market. A winning combination!

                  For more information, visit our website, or download the Autonomous RF Measurement Assistant brochure (PDF).

                  Share





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