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Cascade Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

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          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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                Asset 4
                  Company Blog May 28, 2020

                  Blog

                  Integrated Silicon Photonics Wafer Probing Solution - Thermal Ca

                  Autonomous SiPh Measurement Assistant Delivers Thermal Capability Second to None

                  May 28, 2020

                  One of the key features of our Autonomous SiPh Measurement Assistant is its thermal capability, which enables autonomous calibrations at multiple temperatures. Performing measurements of optical devices at multiple temperatures is essential for certain industry compliance standards.

                  Our Autonomous Silicon Photonics Measurement Assistant has become the industry-standard for wafer and die-level silicon photonics probing. We understand that a test engineers’ goal is to be making accurate, repeatable measurements. An integrated, verified solution prevents engineers from spending valuable time on long development projects. We have developed all the tools, fixtures and calibration techniques to enable you to measure your photonic devices in days instead of months or years. From the Photonics Integration Kit to the Calibration Kit, you will get engineering and production-proven, optimized optical measurements right after installation.

                  One of the key features of our Autonomous SiPh Measurement Assistant is its thermal capability, which enables autonomous calibrations at multiple temperatures.

                  Performing measurements of optical devices at multiple temperatures is essential when it is necessary to conform to certain industry compliance standards. Whether it is devices for data centers that need to be tested in high temperature environments or automotive devices that require both hot and cold testing. The challenges that come with testing at multiple temperatures are system drift, air flow impact on the highly sensitive fibers/fiber arrays and the need for re-calibration.

                  Our unique SiPh TopHat is the only solution that provides a completely sealed, dark, shielded and frost-free environment with full thermal capability from -40°C to +125°C. Only the SiPh TopHat enables minimized air flow impact at cold temperatures to the fibers/fiber arrays for stable and repeatable measurement results.

                  In combination with the revolutionary OptoVue/OptoVue Pro and intelligent machine vision algorithms, the  industry first in-situ CalVue feature enables hands-free autonomous calibration and re-calibration at multiple temperatures. Thermal calibration intervals are completely configurable as the impact of thermal drift on fibers varies over the desired temperature range.

                  The SiPh TopHat was designed to prevent stiction which impacts motorized positioner accuracy. Cable management is designed into the mounting plates for both fibers and positioner cables. An exclusive ITO-coated TopHat window allows easy setup of probes without having to open the thermal chamber.

                  Some key features of the SiPh TopHat include:

                  • Dark, shielded and frost-free
                  • -40°C to +125°C
                  • Autonomous calibrations at multiple temperatures
                  • Unique window for easy setup
                  • Minimized air flow impact on fibers/arrays
                  • Reliable and accurate measurements

                  For more details on this thermal capability and other key benefits, visit the Autonomous Silicon Photonics Overview page at our site, or download the brochure here.

                  Share





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