Today’s 5G enables new transmission frequencies in the millimeter-wave range (>30GHz) which requires a high-fidelity RF capable probe head. These frequencies are now available and have plenty of high-speed bandwidth but do not have a good transmission range. To address this, 5G products use a sophisticated Antenna Array comprised of 16 or 32 mmWave signals per die for increased range. This in turn increases the number of signals required to historically high numbers. Additionally, the 5G AiP (Antenna in Package) market needs to move from x2 to x4 parallel testing.
FormFactor now offers the Pyramid P2000, which expands the maximum probe face from 10×37 to 10x50mm and expands the total number of signals from 800 plus to 2000 plus. This, in turn, allows for higher parallelism in die testing.
The Pyramid P2000 delivers a number of features and benefits, including:
The larger probe face allows for a higher parallelism test by having a larger DUT (die under test) area. This delivers higher throughput per test cell and a lower cost-of-ownership for probe cards.
- More PCB Interface Points
More PCB interface points means a higher number of RF lines. In fact, the P2000 can support more than 250 mmWave RF connections. This enables RF Antenna Array testing for 5G.
The extension of the Pyramid Probe family is building on 20 plus years and the P2000 delivers more mmWave RF capability than ever before. For more information, explore , or download our RF Pyramid Probe Series datasheet on our site.