As semiconductor devices push into sub-THz frequencies and silicon photonics moves rapidly from research labs into high-volume manufacturing, wafer-level testing has become both a critical bottleneck and a competitive advantage.

Achieving accurate, repeatable wafer-level test results at frequencies up to 250 GHz, while still supporting automated silicon photonics production, requires more than small, incremental upgrades. It calls for new probing architectures, smarter calibration approaches, and test solutions that can move seamlessly from the lab into production.

To address these challenges, FormFactor and Microtron will host a one-day technical seminar on January 28, 2026, supported by their partners Keysight and Advantest, at HTC Eindhoven, focused on the latest innovations in high-frequency wafer-level probing and silicon photonics testing.

 

Why High-Frequency and Silicon Photonics Wafer Testing Matters

Applications like 6G wireless, automotive radar, high-speed interconnects, and photonic integrated circuits (PICs) are pushing wafer testing into entirely new territory. Engineers are being asked to deliver higher accuracy, better repeatability, and faster throughput, often at frequencies where traditional approaches begin to break down.

Conventional wafer test methods often fall short when it comes to:

  • Maintaining signal integrity at mmWave and sub-THz frequencies
  • Achieving consistent, repeatable results across R&D and production
  • Scaling silicon photonics test workflows from characterization to high-volume manufacturing

This seminar tackles those challenges head-on, highlighting proven wafer-level probing systems, advanced calibration techniques, and silicon photonics test solutions that are already being used on next-generation devices.

 

What You’ll Learn

Next-Generation Broadband Wafer-Level Probing (DC–250 GHz)

Learn how the latest probing systems make single-sweep measurements up to 250 GHz possible, simplifying test setups without compromising signal integrity. Live demonstrations will show how these solutions support both advanced device characterization and manufacturing test.

Keysight’s New 250 GHz Frequency Extender

Keysight will introduce its new 250 GHz frequency extender, demonstrating how it integrates directly with wafer-level probing systems to deliver faster, more confident broadband measurements.

Modal Calibration for Accuracy and Repeatability

Discover how Modal Calibration, a differential-focused calibration approach, improves precision, repeatability, and measurement correlation across both advanced research and high-volume wafer test environments.

Silicon Photonics Testing: From Lab to Production

See how FormFactor’s silicon photonics probing technologies support scalable, automated wafer-level testing—from early device development through high-volume production:

  • Pharos™ – A precision probe designed for automated, repeatable edge coupling in wafer-level silicon photonics testing
  • TRITON™ – A robust, production-ready solution optimized for high-volume silicon photonics manufacturing test

 

Seminar Agenda at a Glance

Date: January 28, 2026
Time: 9:00 – 17:30
Location: HTC Eindhoven

Agenda highlights include:

  • Broadband single-sweep DC–250 GHz wafer-level probing systems
  • Keysight frequency extender technology
  • Modal calibration techniques for advanced wafer test accuracy
  • Silicon photonics lab and production test solutions
  • Live demonstrations, expert discussions, and extended networking

Each technical session includes time for in-depth questions, with hands-on conversations continuing throughout the exhibit and networking areas.

Who Should Attend?

This seminar is built for engineers and technical leaders working at the leading edge of wafer-level test and silicon photonics innovation, including:

  • RF, mmWave, and sub-THz test engineers
  • Silicon photonics researchers and device engineers
  • Manufacturing and production test specialists
  • Engineering managers planning the transition from R&D to high-volume production

 

Register Now — Seats Are Limited

Join industry experts for a full day of practical insights, live demos, and peer-to-peer discussions focused on where wafer-level probing and silicon photonics testing are headed next.

Register now to secure your seat: https://www.formfactor.com/events/labtofab26/