Enabling and Optimizing Silicon Photonics Coupling
May 9, 2019
Measurement of silicon photonics devices need optical as well as high speed digital capabilities. Our integrated SiPh solution allows sub-micron manipulation of optical fibers positioned above the wafer, automatically optimizing fiber coupling position.
Silicon photonics (SiPh) technology is finding early adoption in data center applications with emerging applications such as automotive LIDAR, likely to follow. The key to making successful measurements on silicon photonic devices is the integration of probe, positioning and test and measurement technologies.
Measurement of silicon photonics devices need optical as well as high speed digital capabilities. Our integrated SiPh solution allows sub-micron manipulation of optical fibers positioned above the wafer, automatically optimizing fiber coupling position. Contact Intelligence uses machine vision technology to automate Theta X, Y and Z axis calibrations and alignments enabling measurements out of the box, reducing what used to take days, weeks or months to a matter of minutes. When combined with autonomous DC and RF, measurement options expand from Optical-Optical to include PhotoDiodes, Optical Modulators and more.
Our SiPhTools application bridges the gap between Velox and 3rd party applications such as the Keysight Photonics Application Suite, which also runs on the Probe Station PC. Data flows through a central Message Server hub via a single interface to the end user’s Test Executive (e.g. the Keysight Test Automation Platform).
Using sophisticated optical alignment algorithms combined with high speed, high precision piezo control, our silicon photonics solution automates optimal fiber coupling position. Enabled by Contact Intelligence, this new solution can rapidly lower test times and improve time to market. The new system provides both the flexibility to operate in a dynamic, engineering environment, as well as the stability and reproducibility required for production test.
Check out the video showcasing the new Autonomous Silicon Photonics Measurement Assistant below: