There are many challenges with making very high frequency measurements over a broadband to mm-Wave. Some of these challenges include:

  • Single sweep measurements from KHz to 100GHz plus, which used to be performed in multiple bands
  • The need for device modeling and circuit characterization to be accurate and repeatable
  • The need for measurements over a broad temperature range (-60 Celsius to +220 Celsius)

Together with Keysight, FormFactor has developed the capability of delivering up to 130GHz S-parameter measurements. In our third video presentation in our Test Insights series, RF Market Director, Anthony Lord, discusses the need for device modeling and circuit characterization with high accuracy and repeatability, as well as the challenges of making these measurements over extended temperature ranges.

Be sure to check out our other Test Insights video presentations:

5G Production Test Considerations – Bringing 5G to market requires an array of supporting tools to ensure the end products meet expectations. It will require significant performance advances in chip technology and manufacturing processes—all the while keeping price/performance at an economically viable level.

Solving the Data Center Energy Crisis with Silicon Photonics – Dr. Choon Beng Sia presents on the application of Silicon Photonics devices, how these new devices can help lower energy consumption in data centers, why accurate and reliable wafer-level photonics test are needed, and how FormFactor is helping to address the challenges of testing SiPh devices.