Test Insights – Solving the Data Center Energy Crisis with Silicon Photonics
July 6, 2020
Dr. Choon Beng Sia presents on the application of Silicon Photonics devices, how these new devices can help lower energy consumption in data centers, why accurate and reliable wafer-level photonics test are needed, and how FormFactor is helping to address the challenges of testing SiPh devices.
A deluge of business data flows into corporate data centers each day, faster than anyone can sort through it. At the same time, consumers going about their day—communicating, browsing, buying, sharing, searching—create their own enormous trails of data. Widely cited forecasts suggest that total electricity demand of information and communications technology (ICT) will accelerate in the 2020s, and by 2030, 20 percent of the world’s energy produced will be consumed by IT.
Silicon Photonics is believed to be one solution to the data center energy crisis. A recent presentation from Dr. Choon Beng Sia, titled “Solving the Data Center Energy Crisis with Silicon Photonics,” presents the application of Silicon Photonics (SiPh) devices, how these new devices can help lower energy consumption in data centers, why accurate and reliable wafer-level photonics test are needed, and how FormFactor is helping to address the challenges of testing SiPh devices.
He will cover a range of factors that affect data center energy consumption including the adoption of:
- Big data analytics
- Artificial intelligence
- Genomics revolution
- Augmented reality
- Financial acceleration
- Self-driving automobiles
- Video transcoding
- Internet of Things (IoT)
This is our first video presentation in our new Test Insights series. Test Insights is a series of short presentations on topics related to semiconductor wafer test and measurement. Our content experts discuss emerging applications and the challenges associated with characterizing and validating their performance. The presentations address new devices, technologies and materials, and the solutions to overcome their specific test and measurement requirements — from the engineering lab to the production fab.