Velox™ is our unique probe station control software suite. It is the universal standard for semi- and fully-automated probe systems, enabling seamless communication between the user and more than 15 different platforms. It supports our newest wafer-level test products and provides older probe stations with the benefit of ongoing software development.
Velox reduces total cost of ownership by minimizing training efforts and providing faster time to robust and reliable data. As a key element of our exclusive Contact Intelligence™ technology for autonomous operation, it allows the user to perform measurement tasks faster, safer and more accurately. Velox enables safe and fast wafer loading, easy test automation and measurement system integration, while preventing costly damage of probes and probe cards throughout the entire measurement cycle.
Velox is installed on more than 600 FormFactor probe stations. Strong customer relationships and continuing advancements make Velox software the clear leader in probe station control.
The new Velox 3 is loaded with new features and enhanced existing features, including:
- New icons and skins
- Windows 10 compatible
- Loader integration
- Contact Intelligence technology
- SECS/GEM interfaces
- Workflow Guide
- Velox Setup Tool
You can also check out videos below that highlight some of features that make Velox the probe station control software of choice:
AutoAlign – the most ergonomic and fastest way to align a wafer in X, Y and theta and determine the wafer diameter and die size. It creates a wafer map corresponding to the evaluated die indices and number of recognized dies in both axes.
VueTrack™ – enables unattended testing over multiple temperatures for positioners or probe cards by automatically aligning probes to pads, utilizing the eVue Pro microscope. It eliminates the need for manual re-adjustment and ensures constant contact quality.
ReAlign™ – enables unattended testing over multiple temperatures for probe cards on the CM300xi probe station by automatically aligning probes to pads, utilizing three system-integrated cameras. It is recommended especially for applications with limited microscope view, such as vertical and Pyramid probe cards, or when using a test head.
CellView – allows you to easily navigate and orientate on parts of the wafer that are out of view.
Visit the Velox 3 probe station control software page on our web site or download the Velox 3 brochure for more information.