For more than 30 years, WinCal has been the market-leading RF calibration software. It’s a comprehensive and intuitive calibration, validation, measurement, and analysis software tool to achieve accurate and repeatable on-wafer S-parameters (and other VNA-related) measurements. These measurements are crucial for precision device modeling/characterization and engineering RFIC tests.

In recent years, improvements in usability and features have made the software the best-in-class for RF test and measurement. The latest version of WinCal 5.0 builds upon these improvements and offers even more functionality.

Attend this webinar and learn:

  • An overview of the new modernized WinCal 5.0 user interface
    • New toolbar in line with Velox look-and-feel
    • Real-time system setup full status information
    • Light mode available in system options
    • New system setup features and options, and more
  • New 1-port Least Square Calibration algorithm
    • New algorithm that allows calibration of 1-port sub-THz and THz setups using a series of reflects
    • Instead of generating 3 equations to solve with 3 standards for 3 unknown VNA error terms, the method generates N (> 3) equations to solve for 3 unknown errors.
  • Strategies to leverage the software’s vast capabilities for measurements and post-processing

We will discuss the new user interface approaches to streamline fast and efficient system configuration and operation. This includes increased homogenization with our market-leading Velox™ probe station control software. We will show the groundbreaking workspace approach to dynamically optimize the measurement environment and suit device and measurement needs.

To attend the webinar, register here.