December 10, 2025
Whether you’re dealing with crosstalk, testing up to 250 GHz, or simply keeping your equipment safe between runs, these solutions help you work faster, improve yield, and make decisions with more confidence.
At EuMW 2025 in Utrecht, FormFactor showcased several innovations designed to make high-frequency wafer-level measurements faster, cleaner, and more reliable. These short video demos feature our engineering experts walking through new capabilities that address real-world challenges in RF device characterization, from crosstalk correction to streamlined coaxial probing and robust storage solutions for high-value probe technologies. Below is a quick overview of each demo, along with links to watch the full videos.
Modal Calibration Demonstration: Correcting Crosstalk in Dual-Signal RF Probes
In this demo, James Hibbert, Engineer at FormFactor’s Center of Expertise, introduces our new Modal Calibration Algorithm, developed specifically to address one of the most persistent challenges in dual-signal RF probing: unwanted crosstalk.
The video walks through:
- How modal calibration mathematically isolates and removes coupling effects
- Why traditional calibration alone can’t sufficiently correct crosstalk at high frequencies
- How engineers can apply this workflow to achieve cleaner, more accurate S-parameter measurements
As today’s RF devices push into higher bandwidths and tighter integration, even a small amount of crosstalk can throw off your measurements and slow down development. Modal calibration gives engineers a straightforward, repeatable way to clean up probe-tip errors and get more trustworthy data.
InfinityXF™ Probe Introduction: 250 GHz Coaxial Probing Made Simple
Ken Dawson, Senior Staff Product Solutions Engineer, introduces the InfinityXF™ Probe, FormFactor’s newest coaxial probing platform engineered for clean, repeatable measurements up to 250 GHz.
The demo highlights:
- A newly engineered structure that keeps the probe steady, even at extremely high frequencies
- Simplified setup steps that cut down configuration time for broadband modeling and high-speed digital measurements
- How InfinityXF improves repeatability and reduces operator-induced variability
AI accelerators, mmWave wireless systems, high-speed serial links—any application where clean, precise VNA measurements make all the difference.
Storage Pod Solutions: Protecting High-Frequency Probes with Smart, Scalable Storage
In this overview, Chris Brockman, RF Segment Manager, demonstrates FormFactor’s Storage Pod Solutions, designed to protect and organize precision RF probes and accessories, especially valuable for labs managing multiple probe types and frequency ranges.
Key capabilities shown:
- Secure, contamination-controlled storage for delicate probe tips
- Modular pod configurations for different probe families
- Improved traceability and lifecycle management for high-value test assets
Taking care of your probes and storing them correctly goes a long way, helping them last longer, keeping your setups running smoothly, and ensuring your measurements stay consistent.
Together, these demos show how FormFactor helps engineers push the limits of what’s measurable while cutting out the hassles that slow testing down. Whether you’re dealing with crosstalk, testing up to 250 GHz, or simply keeping your equipment safe between runs, these solutions help you work faster, improve yield, and make decisions with more confidence.