February 5, 2026
By combining modular hardware, advanced calibration software, and unattended measurement capabilities, EVOLVITY 300 helps engineers reduce complexity, improve throughput, and generate the high-quality data required for next-generation RF and mmWave devices.
As RF, mmWave, and sub-THz devices push into higher frequencies and tighter margins, wafer test environments have to deliver accurate, repeatable results without slowing engineers down. From advanced RF modeling to load-pull characterization and unattended mmWave measurements, engineers need a platform that reduces complexity without compromising precision.
The EVOLVITY™ 300 wafer probe system was built to address these challenges head-on. With a compact footprint, modular RF architecture, and deep integration with FormFactor probes, frequency extenders, and WinCal® calibration software, EVOLVITY 300 enables reliable RF wafer testing from MHz to THz, all in a streamlined, easy-to-use system.
Below, we take a closer look at the RF applications EVOLVITY 300 supports and how it fits into modern wafer-level test workflows.
High-Frequency RF and mmWave Wafer Test from MHz to THz
EVOLVITY 300 is well suited for high-frequency wafer probing, supporting mmWave and sub-mmWave S-parameter measurements with both coaxial and waveguide configurations. Its modular on-wafer integration places frequency extenders close to the device under test (DUT), minimizing signal loss and improving measurement accuracy across the full thermal range.
A standout capability is optimization for FormFactor’s InfinityXF™ coaxial probes, including the industry-leading single-sweep DC to 250 GHz solution developed in collaboration with Keysight. By eliminating the need for multiple frequency extenders or mixed probe types, engineers can simplify their RF test setups while maintaining confidence in measurement fidelity.
Key benefits for RF wafer test include:
Streamlined mmWave Characterization for RF Modeling
When it comes to RF modeling and device characterization, repeatability and ease of use matter just as much as raw performance. EVOLVITY 300 provides a space-efficient, ergonomic platform that simplifies on-wafer probing workflows while supporting advanced calibration and analysis through WinCal.
With its stable mechanical design and precise probe positioning, engineers can generate high-quality S-parameter data suitable for:
This makes EVOLVITY 300 well-suited for both R&D labs and pre-production environments where accurate wafer-level data directly impacts downstream design decisions.
Low-Loss Load-Pull Measurements for Power Optimization
Load-pull measurements play a key role in optimizing RF power amplifiers and transistors, especially at mmWave frequencies where even small losses can limit tuning range. EVOLVITY 300 addresses this challenge with direct-dock load-pull integration.
FormFactor’s modular RF arms allow direct connection of load-pull tuners, including the latest Nano5G™ series from Maury Microwave, creating the shortest possible signal path. This low-loss configuration maximizes tuning range while preserving measurement accuracy.
Applications enabled by EVOLVITY 300 load-pull testing include:
By reducing interconnect losses and mechanical complexity, engineers can focus on extracting maximum performance from their devices.
Autonomous RF: True Unattended mmWave Wafer Test
As wafer test setups become more complex, manual calibration and constant operator oversight can quickly turn into bottlenecks. EVOLVITY 300 is fully compatible with FormFactor’s Autonomous RF Measurement Assistant, enabling true unattended RF and mmWave measurements.
Working seamlessly with WinCal, Autonomous RF continuously monitors measurement drift and automatically re-calibrates when predefined error limits are exceeded. This ensures consistent data quality, even during long test runs.
Autonomous RF capabilities include:
Engineers can confidently run tests overnight, on weekends, or during holidays, dramatically increasing test cell utilization without sacrificing accuracy.
Over-Temperature RF Wafer Testing from –60 °C to +300 °C
Many RF devices are expected to perform reliably across wide temperature ranges, particularly in automotive, aerospace, and advanced communications. EVOLVITY 300 supports fully autonomous over-temperature RF probing from –60 °C to +300 °C.
The system can be configured with a fully EMI-shielded TopHat™ enclosure or an open-top setup using IceShield™, providing flexibility for different lab environments while maintaining RF measurement integrity.
This capability enables:
Modular RF Arm Ecosystem for Maximum Flexibility
EVOLVITY 300 is compatible with FormFactor’s modular RF arm ecosystem, allowing engineers to quickly reconfigure test setups for different applications. RF arms and positioners support coaxial probes, waveguide tuners, load-pull tuners, and Keysight 170/250 GHz PNA-X frequency extenders.
Convenient storage pods provide a safe, ergonomic way to store fully populated RF arms when not in use, reducing setup time and minimizing risk of damage.
This modularity makes EVOLVITY 300 adaptable as RF wafer test requirements evolve, without the need for major system redesigns.
Enabling the Next Generation of RF Wafer Test
From high-frequency S-parameter measurements to low-loss load-pull characterization and fully autonomous mmWave testing, EVOLVITY 300 delivers a flexible, high-performance platform for modern RF wafer test applications.
By combining modular hardware, advanced calibration software, and unattended measurement capabilities, EVOLVITY 300 helps engineers reduce complexity, improve throughput, and generate the high-quality data required for next-generation RF and mmWave devices.
For more details, be sure to download Tech Spotlight: RF Applications on EVOLVITY 300.