November 2008

FormFactor Doubles the DRAM Test Capacity of Test Equipment with New Wafer Probe Card Capability

DC-BoostTM test technology brings DRAM industry closer to one-touchdown wafer testing and enables significant reductions in total test time and cost of test

LIVERMORE, Calif. – November 11, 2008 – FormFactor, Inc. (Nasdaq: FORM) today introduced DC-Boost, an advanced TRETM test technology to increase probe test ...

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