February 2009

FormFactor Reduces Flash Memory Test Costs with New Harmony OneTouchTM ATC Full-Wafer Contact Probe Card Solution

Enhanced platform increases test cell efficiency for advanced 300-mm Flash wafers

LIVERMORE, Calif. – February 9, 2009 – FormFactor, Inc. (Nasdaq: FORM) today introduced the newest addition to its suite of advanced full-wafer contact probe cards for NAND and NOR Flash memory 300-mm wafer testing—the Harmony ...

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