Addressing Circuit Characterization for Faster Time-to-Market
May 16, 2019
The specification of a test system to perform wafer-level measurements on circuits such as amplifiers, mixers and filters can be challenging, especially when a single wafer can include multiple circuit types. Our MeasureOne program addresses these challenges for faster time-to-market.
MeasureOne™ is FormFactor’s solutions program based on collaboration with best-of-breed partners to offer test and measurement solutions with validated performance.
Left to fend for themselves, semiconductor test engineers can spend an inordinate amount of time integrating and troubleshooting their systems. Complexities of integration can be a tremendous obstacle in the path to bringing products to market in a timely, profitable fashion. In some instances, hardware and software from multiple suppliers must be configured and integrated to ensure data correlation and measurement accuracy between different locations. Fortunately, our MeasureOne program simplifies the tasks of defining, integrating, and validating systems for circuit characterization.
The specification of a test system to perform wafer-level measurements on circuits such as amplifiers, mixers and filters can be challenging, especially when a single wafer can include multiple circuit types. The tests required to validate these structures are wide-ranging and complex, including S-parameters, DC-parameters, noise figure, gain compression and intermodulation distortion. Measurement and calibration accuracy are critical, especially where testing must be correlated between multiple locations.
To configure a system to meet these challenges you have to specify and source instrumentation, wafer probe stations, RF & DC probes and software from multiple suppliers and then integrate and prove these on-site before your first device can be tested. It can take weeks, or even months, before you can execute your first measurements with the confidence that there is data correlation and measurement accuracy between different locations.
Together with our MeasureOne partner Keysight Technologies, FormFactor can address these challenges directly by providing a fully integrated wafer-level measurement solution with guaranteed configuration, installation and support. Our wafer-level probe stations, microwave and DC bias probes, and calibration tools combined with Keysight’s test instrumentation and measurement and analysis software allow you to perform comprehensive measurements on all structures.
For example, a wafer-level measurement solution might incorporate our new SUMMIT200 semi-automated wafer probe system for wafers up to 200mm with Infinity Probes®, WinCal XE™ calibration software and Impedance Standard Substrates for calibration, and a Keysight Technologies PNA or PNA-X microwave network analyzer, a Keysight N6705B DC power analyzer, and Keysight‘s WaferPro Express measurement software platform. Or perhaps a different FormFactor probe system or probe style is better suited for your needs, or different Keysight instruments – both companies offer a broad range of high-performance, compatible products to meet a sweeping array of requirements.
To ensure all these elements work together to meet your application needs, we, together with Keysight, will pre-validate the system configuration prior to delivery. Our solutions experts will install and verify system S-parameter and DC parametric performance, and Keysight solutions experts will verify optional application functionalities. Calibration is essential to ensure accurate and repeatable tests, and this can be particularly challenging in a wafer probing environment.
With a guaranteed wafer-level measurement solution from FormFactor and Keysight Technologies, you have accurate and repeatable testing and achieve faster time to first measurement. Be sure to check out the MeasureOne website for details and check back with our blog for additional MeasureOne updates.