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Cascade Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

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          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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                Asset 4
                  Company Blog March 12, 2020

                  Blog

                  Integrated Silicon Photonics Wafer Probing Solution on 300 mm Probe Station CM300

                  New Edge Coupling Probe Solutions for Silicon Photonics (SiPh) Devices

                  March 12, 2020

                  We recently announced new edge coupling features that enhance our silicon photonics (SiPh) solution for the CM300xi probe station that allow us to extend our ability to couple fibers to the edge of SiPh devices for both singulated die and on wafers.

                  We recently announced new edge coupling features that enhance our silicon photonics (SiPh) solution for the CM300xi probe station. These features allow us to extend our ability to couple fibers to the edge of SiPh devices for both singulated die and on wafers, giving test engineers the capability to measure device performance consistent with native operating conditions. New machine vision techniques and in-situ calibration, along with integration of Keysight’s Test Automation Platform (TAP) software, and customers are able to more quickly accelerate products to market.

                  According to research from Inkwood Research, “the global silicon photonics market is projected to rise at a CAGR of 19.70% throughout the forecasting years of 2019-2027.” Enabling the rapid transfer of enormous amounts of data using optical signals instead of electrical signals, silicon photonics is continuing to gain momentum primarily with regards to data center and automotive applications.

                  The new edge capabilities provide engineers the flexibility to perform measurements optimized for their device designs and it expands our long-standing MeasureOne partnership with Keysight for silicon photonics applications. The new features include:

                  • Die and wafer-level edge coupling for photonic devices provides measurement capability that closely simulates device operation
                  • Advanced, in-situ optical positioner calibration with our OptoVue™ and OptoVue™ Pro for faster time to accurate measurement results
                  • Thermal range capability from -40 to 125°C in an enclosed environment
                  • In-situ power measurements of single fibers and fiber arrays to examine insertion path loss
                  • Integration of our probe station control and wafer-level measurement in Keysight’s N7700210C Wafer Prober TAP Plug-In software provides test steps that can be added to work-flow sequences without instrument-level programming commands
                  • Scalable platform with Keysight’s 77-Series photonic instruments, N437xE Lightwave Component Analyzers up to 110GHz, and PXIe based highly integrated modular DC and RF products shorten the test time of opto-electrical characterization

                  For more information on these new edge coupling features, check out the press release announcement.

                  Share





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