FormFactor will be at the Internal Microwave Symposium (IMS) 2023, June 11 – 16, in San Diego, California. We hope to see you there! You’ll be able to see Formfactor solutions in action, including our automated 220 GHz single-sweep broadband solution and a benchtop S-parameter solution for mmW measurements featuring our latest WinCal software, as well as analytical probes.
FormFactor will also be leading some workshops and delivering some presentations, including the following:
Sunday, June 11, 5:00pm (Workshop): Scaling Measurement Methodologies Using Cryogenic TaaS Framework for Higher Quality cryo-LNAs and Reliable Qubit Readout Chains
Brandon Boiko, Cryogenic Applications Engineer
As superconducting quantum computers scale, cryogenic microwave components in the qubit control and readout chain must be appropriately tested and qualified to ensure the consistency and high fidelity of quantum computation. Furthermore, system uptime is critical for commercialization, which is dependent on reliably predicting maintenance cycles and expediting downtime recovery. Both requirements highlight the need for standardized measurement protocols to scale the test capability in the industry. Here we will examine a test framework where we describe procedures for conducting functional, reliability, and integrated testing on cryogenic components. Our pilot use-case investigates calibration and test methodologies for gain and noise figure measurements of low temperature LNAs. Finally, we will discuss how to scale these measurements for high volume reliability testing.
Thursday, June 15, 10:45 – 11:00am (Presentation): Dynamic Height Adjustment Using Vector Network Analyzer Based Contact Sensing Using FormFactor WinCal XE and Velox
Gavin Fisher, Sr. Staff Applications Specialist
For testing at mmWave frequencies, the probe final positioning tolerances are critical. Z variation of substrate to probe tip can be a significant final positioning error contributor, potentially due to inadvertent contaminants on the rear of the substrate which affect planarity. Using mmWave spot measurements, accurate contact can be very accurately determined. Using Formfactor WinCal XE calibration software, and Python scripting in conjunction with our Velox prober control software, these Z variations can be removed by sensing contact and adjusting on the fly. We will show example Python scripting and video of a real-life calibration incorporating dynamic Z adjustment.
Wednesday, June 14, 8:00am (Workshop): Maximizing Return on Investment for On-Wafer Over-Temperature Millimeter-Wave Characterization
Gavin Fisher, Sr. Staff Applications Specialist
The talk will show the best methods for setting up, calibrating, and evaluating measurement performance for measurements spanning WR15 (75 GHz) to WR1 (1100 GHz) over a broad (-40 to 125c) temperature range. This includes approaches to conveniently swap waveguide bands.
We will discuss test executive approaches for multi-wafer over-temperature testing, both using commercial test executives and programming examples using FormFactor Inc. WinCalXE and Velox software to automate on-wafer data measurement and analysis.
Single-sweep measurements from 900 Hz to 220 GHz will be highlighted along with measurements at elevated temperatures. Examples in Wincal itself and supporting video will be provided.
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FormFactor will be in booth 843. We hope to see you there!