FormFactor is proud to participate in the IEEE International Microwave Symposium (IMS) 2025, held this year in San Francisco. IMS is the leading global event for RF and microwave engineering, bringing together experts and innovators to explore the technologies shaping the future of wireless communication.

June 15–20, 2025 | Booth 750 | Moscone Center, San Francisco

At Booth 750, FormFactor will showcase industry-leading wafer probe solutions and technologies supporting broadband, millimeter-wave (mmW), terahertz (THz), and load pull measurements.

 

SUMMIT200 – 220 GHz Broadband Solution

Developed in collaboration with Keysight Technologies, Virginia Diodes, and Dominion Microprobes, the SUMMIT200 platform supports single-sweep, broadband measurements up to 220 GHz. It delivers best-in-class dynamic range, leveled output power, and stability—critical for next-generation 5G and 6G device characterization.

Key features include:

  • Continuous swept measurements from 900 MHz to 220 GHz
  • Over-temperature testing enabled by FormFactor’s patented RF TopHat, providing EMI shielding and thermal isolation
  • Autonomous RF operation with real-time calibration and re-calibration via WinCal
  • Modular design supporting RF, mmW, and load pull applications

 

EPS150mmW

The EPS150mmW is a flexible 150 mm probing solution designed for coaxial and waveguide RF and mmW applications, including S-parameters, load-pull, and noise measurements.

Features:

  • Programmable, modular positioners
  • SlimVue microscope for high-resolution optical alignment
  • Vibration isolation and submicron stage accuracy
  • Engraved mmW platen guides compatible with SIGMA Kits

 

EVOLVITY 300

EVOLVITY 300 is a compact, semi-automated 300 mm wafer probe system designed to simplify on-wafer RF testing. It offers high configurability and seamless integration for complex RF measurement setups.

Highlights include:

  • Swappable platen inserts for RF, DC, and probe card applications
  • Manual wafer loading with front access to thermal chuck
  • Autonomous RF calibration with WinCal 5 and ModalCal support
  • Mechanical lift and short RF cable paths for optimal signal fidelity

 

Partner Highlights

Focus Microwaves – Booth 659

  • Featuring the EPS200 manual probing solution for mmW, THz, and load pull applications

Keysight Technologies – Equipment featured at our booth:

  • N5291A-402/403 PNA Millimeter-Wave System (SUMMIT200)
  • B2902B Precision SMU (SUMMIT200 and EVOLVITY 300)
  • N5247B-423/425 PNA-X Microwave Network Analyzer (EVOLVITY 300)
  • N5227B-219/220 PNA Microwave Network Analyzer (EPS150mmW)

 

Technical Presentations

MicroApps Seminar

Tuesday, June 17 | 13:00 – 13:15 | MicroApps Theater

Speaker: Gavin Fisher, FormFactor Inc.

Topic: TUMA12 – Comparison of Banded and Single-Sweep Measurements up to 220 GHz

This talk explores how recent coaxial probe innovations enable broadband measurements beyond 200 GHz, simplifying test setups and eliminating the need for multiple banded configurations.

 

Industry Workshop

Thursday, June 19 | 08:00 – 09:40 | Room 204

Speakers: Gavin Fisher and James Hibbert, FormFactor Inc.

Title: WinCal – The Engineer’s Flexible Friend

This session highlights the advanced capabilities of the WinCal platform, including its integration with open-source software and the expanded API support introduced in the 5.1 release—enabling automated workflows and advanced analytics.

 

MicroApps Seminar

THMA9: Advancing RF Technologies – The Role of Wafer-Level Test in 6G, AI, and Quantum Computing

Thursday, June 19 |11:30 – 11:45 | MicroApps Theater

Speaker: Raajit Lall, FormFactor Inc.

This keynote examines how wafer-level testing supports emerging technologies such as Antenna-in-Package (AiP), quantum computing, and AI-integrated THz systems.

 

MicroApps Seminar

THMA10: A Commercial Implementation of Modal Calibration to Improve GSSG Calibration

Thursday, June 19 |11:45 – 12:00 | MicroApps Theater

Speaker: James Hibbert, FormFactor Inc.

This presentation introduces a commercial implementation of modal calibration for differential measurements, addressing limitations of conventional GSSG methods with real-world validation.