As semiconductor technologies move into more demanding applications, from defense sensing to quantum computing, engineers are running into the same challenge: getting reliable wafer-level measurements under extreme conditions.

This spring, FormFactor is showcasing its latest innovations at two key industry events, both focused on solving performance challenges at the wafer level, before packaging adds risk.

SPIE Defense + Security 2026

April 26–30 | National Harbor, MD
Booth #925

Defense and commercial sensing applications, especially IR sensors, require stable, contamination-free testing, often at cryogenic temperatures.

At SPIE, FormFactor will highlight solutions that help engineers validate performance early, without second-guessing the data:

Cryogenic probing (PLC50 / PLC50-dry)

  • Manual probing down to < 6 K
  • DC/RF capability with flexible cooling (LN₂, LHe, cryocooler)
  • Ideal for early-stage device characterization

Automated cryogenic wafer test (PAC200-auto)

  • New autoloader for more consistent, scalable test workflows
  • Supports optical instrumentation (e.g., IR sources)
  • Up to 200 mm wafers (300 mm capable)

High-vacuum probing (PAV200)

  • Vacuum levels to < 1×10⁻⁴ mbar
  • Broad DC/RF test capability
  • Thermal control from -60°C to 300°C

Bottom line: Move from research setups to automated wafer test without losing measurement confidence.

Quantum Australia 2026

April 28–30 | Adelaide, Australia
Booth #28

As quantum technologies move closer to real-world deployment, cryogenic testing and wafer-level scalability are quickly becoming bottlenecks.

This year’s theme, “The translation of Quantum”, highlights the shift from research to industry. FormFactor solutions are built to help close that gap:

Flatiron

  • Stable probing at millikelvin temperatures
  • Designed for sensitive qubit characterization

IQ2000

  • Cryogenic wafer-level probing for scalable quantum workflows
  • Improves repeatability across measurements

LF600

  • High-frequency capability for RF/microwave quantum devices
  • Enables precise signal validation

Echo 5Q

  • Advanced platform for next-generation quantum test
  • Supports complex device architectures and faster iteration

Bottom line: Get repeatable, scalable measurements as you move from quantum research into early manufacturing.

Attending SPIE or Quantum Australia? Stop by and talk with our team about your test challenges, and how to get more out of your wafer test strategy.