As semiconductor devices keep pushing into higher frequencies and tighter integration, wafer-level testing has to keep up. Engineers working on 6G, high-speed interconnects, digital high-bandwidth communications systems with advanced modulation schemes, and next-generation wireless systems need accuracy, speed, and repeatability at frequencies that used to be out of reach.

That’s why FormFactor is introducing the InfinityXF™ Probe, a new coaxial wafer probe that delivers broadband performance from DC all the way up to 250 GHz in a single sweep.

InfinityXF builds on the proven Infinity platform, expanding bandwidth to 250 GHz without the hassle of multiple frequency extenders or complex calibration steps. Developed in partnership with Keysight Technologies, the probe works seamlessly with the PNA-X system and new 250 GHz coaxial frequency extension modules, using ruggedized 0.5 mm coaxial connectors.

This approach streamlines wafer testing, eliminates the mix of coaxial and waveguide probes, and cuts down on setup time. The result: faster measurements, consistent repeatability, and lower uncertainty in S-parameter data.


Key features of InfinityXF, include:

  • Up to 250 GHz single sweep range with unparalleled accuracy.
  • Flexible configurations – Available in GSG, GSGSG, and GSSG styles, supporting pitches from 50 µm to 150 µm. 50, 75 100 µm initially, more to follow.
  • Ultra-compact body – Directly docks to Keysight NA5307A, reducing insertion loss while maintaining excellent return loss.
  • Clear tip visibility – Makes it easier to place tips precisely and consistently, saving setup time and reducing errors.
  • Durable rhodium tips – Provide stable, low-resistance contacts built for long-term use.
  • Wide temperature range – Performs reliably from –40°C to +175°C and is compatible with FormFactor’s EMI-shielded TopHat enclosure and open environment IceShield™ for over temperature measurements..
  • Ready for automation – Works with FormFactor’s Autonomous RF Measurement Assistant, enabling 24/7 unattended testing with automatic calibration.

InfinityXF is designed for a wide range of use cases, including:

  • Broadband modeling and device characterization
  • High-speed digital communications such as PAM4 448 Gb modulation and PCIe Gen6
  • Load pull and noise characterization
  • Multi-Gbps systems and TIA testing
  • Harmonic and spectral purity measurements

It’s fully compatible with EVOLVITY™ 300, CM300xi, and SUMMIT200 probe systems, making it a flexible solution for both R&D and production.

By extending coaxial single-sweep broadband probing to 250 GHz, InfinityXF gives engineers the accuracy and reliability they need to push the limits of advanced design. Whether you’re validating next-generation wireless systems or ensuring the signal integrity of ultra-fast digital links, InfinityXF helps you move faster and with greater confidence.

For more information, download the InfinityXF Data Sheet.