4 Benefits of the MeasureOne Wafer-Level Measurement Solution (WMS)
January 31, 2019
Together with our MeasureOne partner, Keysight Technologies, we address the challenges of device and circuit characterization while expediting time to first data by providing a fully-integrated wafer-level measurement solution (WMS) with guaranteed system configuration, integration and support.
Together with our MeasureOne™ partner, Keysight Technologies, we address the challenges of device and circuit characterization while expediting time to first data by providing a fully-integrated wafer-level measurement solution (WMS) with guaranteed system configuration, integration and support. The WMS solution contains all of the required hardware, software, interface cables, probes, calibration, and service for a given application.
The benefits of the WMS solution can greatly impact the bottom line, and include:
- Faster Time to Data. Your test cell will be installed and ready for use faster than ever before – without your engineers spending days, weeks, or months setting it up.
- Predictable Performance. Keysight and FormFactor jointly pre-validate all WMS packages, to deliver validated performance all the way to the probe tip, with the option of guaranteed performance in specific applications.
- Complete, Turnkey Solution. Your WMS includes all the automation, workflow support, and custom applications you need. Most standard solutions have undergone factory measured performance testing to validate and characterize their performance.
- Superior Uptime. If your test cell develops a performance issue, goes out of calibration, or needs any kind of setup maintenance, assistance is a phone call away.
It’s easy to spend an inordinate amount of time integrating and troubleshooting your systems. Complexities of integration can be a tremendous obstacle in the path to bringing products to market in a timely, profitable fashion. In some instances, hardware and software from multiple suppliers must be configured and integrated to ensure data correlation and measurement accuracy between different locations. FormFactor’s MeasureOne program alleviates these issues and gives you confidence in a complete solution.
An integrated wafer-level measurement solution will incorporate our Summit™ 200 mm, CM300 semi- and fully-automated wafer probe stations or any other FormFactor probe station with Infinity Probes®, WinCal XE™ calibration software and Impedance Standard Substrates for calibration, and any Keysight Technologies test and measurement instrument. Our three guarantees of configuration, integration and support ensure that you will be up in running in less time – with accurate and repeatable measurements.
Be sure to check out the MeasureOne website for details, and check back with our blog for additional MeasureOne updates.