FormFactor will be attending the APS Physics March Meeting 2022, from March 14-18, in Chicago, Illinois at McCormick Place. Stop by our booth where we will be showcasing our cryogenic probing solution for quantum computing, featuring the IQ3000 and PQ500 probe socket.

The HPD IQ3000 is a high precision fully automated probe station for 150 mm and 200 mm substrates in a 4 K environment. To accelerate the realization of commercial quantum and superconducting computers, we provide chip developers with the tools they need to intelligently iterate on their designs. You can download the IQ3000 data sheet here.

The HPD PQ500, an innovative, high-density RF and DC socket interface for FormFactor’s HPD cryostats, enables developers to test chips without days-long delays for wire bonding and packaging, providing faster time to data. The new test system, the first commercial product of its kind, allows scientists to easily probe DUT pads at temperatures lower than 50 mK, providing the means for earlier and simpler characterization of device features in superconducting or silicon spin qubits, and other devices tested at cryogenic temperatures. 

Booth showcase schedule:

  • Monday, March 14: 7:15pm – 8:45pm CST
  • Tuesday, March 15: 10am – 5pm CST
  • Wednesday, March 16: 10am – 5pm CST
  • Thursday, March 17: 10am – 4pm CST

FormFactor will also be exhibiting and holding a workshop during European Microwave Week, from April 2-7, in London, England. The workshop – RF On-Wafer Calibration and Measurement Eco-system – will share a sneak peek at a new solution for test and measurement to 220 GHz, featuring integrated components from Keysight Technologies, Virginia Diodes and FormFactor. Join  the workshop or visit FormFactor at Stand 1A to learn more.

Up until recently, on-wafer measurements of semiconductor devices, either of narrow band Integrated Circuits or broadband transistors, was typically limited to 67GHz or in some cases 110GHz.  However, with the growing demand of consumer devices working in the mm-wave range, including 5G or automotive radar for example, the requirements are growing for more measurements and data not only to 110GHz, but 220GHz and beyond.  Even if the operating frequencies of these devices are sub 100GHz, the need to characterize the models of the transistors and other components used in these circuits typically is much higher than the working band they are eventually used in.  In addition, it’s helpful to have an understanding of the out of band performance and harmonics of the IC’s, meaning it’s becoming more common for engineers to measure all the way to 220GHz and beyond. And already emerging is research into 6G, that could potentially be working in the 200GHz frequency band. To compound this, the variety of applications and real-world environments our devices are used in, data needs to be collected over a wide temperature range – putting even more demand on today’s testing. As we progress up the frequency spectrum, new developments of RF probes, instrumentation, calibration standards and techniques need to be developed and integrated together to allow easy, accurate, repeatable and trustworthy data. This workshop brings together the on-wafer RF Eco-system providers and users of instrumentation, probes and calibration methods to share experiences and best practices.

Hope to see you in Chicago and London in the weeks ahead!