FormFactor’s Autonomous DC Measurement Assistant delivers innovative change for engineers and lab managers, delivering a complete hands-free, 24/7 testing solution. In our last two blog posts, we’ve covered the first seven features and benefits of the Auto DC system as follows:

Post One

  1. Small pad probing down to 30 µm – at multiple temperatures
  2. Optimized soak times
  3. Optimized contact resistance

Post Two

  1. Automated multi-DUT layout testing
  2. Industry-leading high-performance probes
  3. Motorized positioners
  4. VueTrack™ – Simplified test management enables the ultimate test experience

In today’s final post, we’ll tackle the final set of features and benefits that make Autonomous DC Measurement Assistant the revolutionary system that it is.

  1. Full Thermal Range in a Shielded Environment (Exclusive TopHat with FlexShield)

The Auto DC Measurement Assistant has been designed to integrate seamlessly with FormFactor’s exclusive TopHat. In combination with the patented FlexShield, the solution maintains a dark, shielded and frost-free measurement environment and prevents friction which impacts motorized positioner accuracy. The Auto DC Measurement Assistant enables measurements from -55°C to +200°C.

  1. High Resolution Microscope System

Smaller pad geometries come with several advantages like saving valuable wafer space and reduced pad parasitics. Many devices today have pads as small as 30 µm. To properly see those pads and probe them accurately, a high-resolution microscope system is essential.

FormFactor’s Auto DC Measurement Assistant integrates the eVue high-resolution microscope, enabling highest visibility of contact pads as small as 30 µm with micron level accuracy.

  1. Full Automation with Optional Wafer Handling Unit

With the optional loader that is available for the SUMMIT200 and CM300xi probe systems, the system enables true 24/7 testing with zero idle time even when measuring over temperature. This results in more devices tested in a shorter amount of time. The loader can handle up to fifty wafers provided in SEMI-standard wafer cassettes.

BONUS FEATURE – Remote Probing Over the Internet

Auto DC enables remote probe station management from home or anywhere in the world and enjoy these and other exceptional benefits:

    • Safely and easily place probes down in contact with the test pads
    • Safely move the wafer to different test sites
    • View and manage live microscope viewing of the probes and the wafer
    • View Wafer Map test plans
    • Initiate remote test programs to gather and analyze test data

FormFactor’s Autonomous DC Measurement Assistant creates a paradigm shift for engineers and lab managers. It is now possible to setup a high throughput test cell, for both semi- or fully-automatic systems, offering complete hands-free 24/7 operation.

For more information on Auto DC and its numerous features and benefits, download the complete brochure.