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The Role of 5G Testing in Ultra-Low Latency Applications

The Role of 5G Testing in Ultra-Low Latency Applications

April 24, 2025

Want ultra-low latency out in the real world? It all starts with rock-solid, real-world testing in the lab. Whether you're building autonomous systems, connected factories, or next-gen wearables, your 5G test setup needs to be as fast and flexible as the devices you're building.

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  • New Application Note on an Optimized On-Wafer Passive Load Pull System for 5G

    New Application Note on an Optimized On-Wafer Passive Load Pull System for 5G

    February 22, 2024

    These frequencies offer a shorter range than lower frequencies and can be significantly obstructed by physical barriers such as buildings and trees. To mitigate these issues, each component of the 5G infrastructure needs to be finely tuned for peak performance.

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  • Delivering Advanced mm-Wave Load-Pull Measurements

    Delivering Advanced mm-Wave Load-Pull Measurements

    October 5, 2023

    FormFactor has partnered up with Focus Microwaves and Keysight Technologies to deliver a fully integrated solution for accurate on-wafer mm-Wave load-pull measurements, delivering a number of benefits along the way, including these four.

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  • Test Vision Symposium Presentations Now Available

    Test Vision Symposium Presentations Now Available

    July 14, 2022

    The Test Vision Symposium is a premier workshop for semiconductor and system test experts, organized annually in association with Semicon West to discuss coming trends, innovations, and requirements for semiconductor test. Our team had two great presentations worth sharing.

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2022

February 17, 2022

Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

2021

March 12, 2021

Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE

January 27, 2021

Automotive Chip Shortage Underscores the Need for Efficient Production Test | READ MORE

2020

November 10, 2020

New Webinar – Low Frequency Noise on December 8: Register Now | READ MORE

August 13, 2020

Best ATE Paper Award – 5G Wafer Test and the New Age of Parallelism | READ MORE

July 10, 2020

Test Insights – 5G Production Test Considerations | READ MORE

June 26, 2020

Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE

2019

November 22, 2019

New Paper: Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications | READ MORE

October 24, 2019

New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE

June 14, 2019

Overcoming 3 Challenges with 5G Production-Level Test | READ MORE

May 3, 2019

Meeting the Challenges of 5G Production Test | READ MORE