Smarter Wafer-Level Power Device Testing
September 5, 2025
Engineers gain confidence that their measurements are accurate and repeatable, while executives see faster throughput, lower labor costs, and reduced risk of equipment damage.
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The Future of Wafer-Level Testing in AI-Driven Chip Design
August 7, 2025
By testing chips at the wafer level, engineers can catch defects early, before investing in expensive packaging steps. That early insight helps improve yields, speed up development, and prevent problems from creeping into production.
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Redefining Wafer Test, Fully Automated Edge Coupling for Silicon Photonics
July 24, 2025
At FormFactor, our engineers have collaborated with IHP Microelectronics to develop the industry's first fully automated wafer-level edge coupling measurement system designed specifically for silicon photonic integrated circuits (PICs).
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Wafer Test Challenges and Solutions: How to Ensure High-Performance Semiconductor Manufacturing
February 14, 2025
From 5G, IoT, and AI applications to advanced packaging and high-bandwidth memory (HBM), ensuring device performance and yield at the wafer level is a critical step in the semiconductor manufacturing process.
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2024
2023
2022
July 1, 2022
Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE
May 12, 2022
Webinar – New Solutions for Analytical Wafer Probing of Silicon and Wide Band Gap Power Devices | READ MORE
April 28, 2022
5x Faster: Thickness Measurements of Wafers and Layers | READ MORE
March 25, 2022
Understanding Wafer Applications in Surface Metrology | READ MORE
March 3, 2022
High-Power Semiconductor Wafer Probing System for Automotive, Renewable Energy, and Industrial Applications | READ MORE
February 17, 2022
Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE
2021
November 5, 2021
Webinars – Enabling Quantum Development and Sub THz Over Temperature Wafer Test | READ MORE
September 2, 2021
On-Demand Workshop: Continuous S-Parameter Measurements to 500 GHz | READ MORE
August 26, 2021
Advanced Temperature Control for Semiconductor Wafer Test: On-Demand Workshop | READ MORE
August 5, 2021
Production Testing of Silicon Photonics Wafers | READ MORE
July 29, 2021
Eliminating 97% of Prober Environment Noise with PureLine 3 Technology | READ MORE
June 17, 2021
The Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE
June 9, 2021
New Webinar – Advances in Analytical Wafer Probing of High-Voltage/High-Current Devices | READ MORE
March 12, 2021
Now Available: Autonomous Operation of Vertical Probe Cards with ReAlign for SUMMIT200 Probe Stations | READ MORE
February 18, 2021
Introducing Velox 3.2 Probe Station Control Software | READ MORE
February 11, 2021
Autonomous RF Delivers Remote Probing from Anywhere | READ MORE
2020
September 17, 2020
PureLine 3 Technology Eliminates 97% of Prober Environment Noise | READ MORE
September 10, 2020
New MeasureOne Partnership to Advance Silicon Photonics Test and Measurement Development | READ MORE
September 3, 2020
New Gold Standard for On-Wafer Noise Testing – The CM300xi-ULN Probe Station | READ MORE
June 26, 2020
Introducing the CM300xi-ULN for Flicker Noise (1/f), Random Telegraph Noise (RTN) and Phase Noise Measurements of Ultra-Sensitive Devices | READ MORE
May 28, 2020
Autonomous SiPh Measurement Assistant Delivers Thermal Capability Second to None | READ MORE
May 5, 2020
Working from Home? Meet Our Application Specialists in Our Virtual Demo Lab | READ MORE
April 23, 2020
Edge Coupling Efficiencies for Wafer and Die Level Applications | READ MORE
April 7, 2020
3D Manual Controls – Making Manual Adjustments on Automated CM300xi Probe Stations | READ MORE
March 12, 2020
New Edge Coupling Probe Solutions for Silicon Photonics (SiPh) Devices | READ MORE
February 20, 2020
Advanced mm-Wave and Terahertz Measurements – Enhanced with Autonomous RF Measurement Assistant | READ MORE
January 30, 2020
The PAC200 Probe Station for Cryogenic Probing Environments | READ MORE
January 23, 2020
Velox 3 Probe Station Control Software – Feature Videos | READ MORE
2019
December 12, 2019
Genius Education Kits – Turnkey S-parameter Measurement Systems for RF and Microwave Test | READ MORE
December 6, 2019
Advanced Packaging – Measuring Deep Etch Trenches | READ MORE
November 5, 2019
Customize a 150 mm Modular Probe Station Starting at $13,880 | READ MORE
November 1, 2019
Experience the All New Velox 3 Probe Station Control Software | READ MORE
October 24, 2019
New Integrated, Automated Probe Solution for Wafer-level Characterization of 5G Devices and Circuits | READ MORE
October 10, 2019
DC, RF and Optical Probe Positioners for the Highest Accuracy Measurements | READ MORE
September 19, 2019
Advanced mm-Wave and Terahertz Measurements on FormFactor Probe Stations – New Solution and 4 Great Features | READ MORE
August 23, 2019
VueTrack vs. ReAlign – Two Innovative Velox Tools for Unattended Testing Over Time and At Multiple Temperatures | READ MORE
August 15, 2019
TESLA200 – 200mm Power Semiconductor Probe Station | READ MORE
August 8, 2019
CM300xi Probe System – Delivering Measurement Accuracy and Reliability | READ MORE
July 18, 2019
Introducing the RFgenius On-Wafer S-Parameter Measurement Package | READ MORE
July 11, 2019
Autonomous RF Measurement Assistant – Improving Accuracy and Time to Market with True Hands-free RF Calibration and Measurements over Multiple Temperatures | READ MORE
May 16, 2019
Addressing Circuit Characterization for Faster Time-to-Market | READ MORE
January 31, 2019
4 Benefits of the MeasureOne Wafer-Level Measurement Solution (WMS) | READ MORE
January 4, 2019
Breaking the Myth of Wafer Probing on Cu for FOWLP | READ MORE
2018
October 4, 2018
Three Benefits of the Estrada WLR Test System | READ MORE
May 24, 2018
Wafer-Level Electromigration – Lowering Operating Costs and Better Data Integrity | READ MORE
May 17, 2018
Wafer-Level Electromigration – Reducing Cycle Time for Faster Feedback | READ MORE
April 26, 2018
EM PLR and EM WLR Data Prove Interchangeable | READ MORE
March 16, 2018
MeasureOne™ Wafer-Level Measurement System – Addressing Test Challenges of Flicker Noise | READ MORE